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Optical Modeling and Analysis 
The Keck Interferometer combines light from the two Keck telescopes for science measurements at 2 and 10 um. The key 10 µm science is the measurement of the emission from dust orbiting nearby stars
The Keck Interferometer combines light from the two Keck telescopes for science measurements at 2 and 10 um. The key 10 µm science is the measurement of the emission from dust orbiting nearby stars.
The Palomar Observatory 5 m Hale telescope and the Palomar Testbed Interferometer (PTI) are shown in this aerial photograph. PTI combines light from apertures separated by up to 110 m for a variety of near-infrared science programs and technology development, including very narrow angle astrometric measurements
The Palomar Observatory 5 m Hale telescope and the Palomar Testbed Interferometer (PTI) are shown in this aerial photograph. PTI combines light from apertures separated by up to 110 m for a variety of near-infrared science programs and technology development, including very narrow angle astrometric measurements.
Starlight from each Keck telescope is steered through a series of active and passive optics to adjust delay and tilt, and them combined with the light from the other telescope to measure interference fringes at 2 and 10 µm
Starlight from each Keck telescope is steered through a series of active and passive optics to adjust delay and tilt, and them combined with the light from the other telescope to measure interference fringes at 2 and 10 µm.

Optical modeling and analysis is the indispensable adjunct of optical design. It's how we know a design does what it was intended to do, or in the alternative, how we ascertain a design's inherent sensitivities and limitations. The tools used in this work are many and varied, ranging from industry standard ray trace products like CODE V and ZEMAX, to Matlab-based codes like MACOS that can be interfaced with other Matlab codes in integrated modeling efforts, to one-off diffraction codes capable of tracking wavefront and pathlength variations at picometer levels.

And just as advanced interferometric, high contrast imaging and active/adaptive optical systems invariably employ multiple optical design capabilities, so also do they make use of multiple optical modeling and analysis techniques. Once again, SIM provides a case in point, having used traditional tools in the design of its compressor optics, one-off diffraction codes in the analysis of its picometer metrology systems and analogous purpose-built codes in the polarization-, wavelength- and diffraction-sensitive analysis of its beam combiner and some of its testbeds.


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